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Design and Fabrication of Edge Coupling ZnO Traveling Wave Photodetectors

Ahmed M Nahhas, (2008) Design and Fabrication of Edge Coupling ZnO Traveling Wave Photodetectors. Elektrika Journal of Electrical Engineering, 10 (1). pp. 8-12. ISSN 01284428

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Official URL: http://fke.utm.my/elektrika/june08/paper2june08.pdf

Affiliations

Umm Al-Qura University, Saudi Arabia, Faculty of Engineering and Islamic Architectures. Dept. of Electrical Engineering, Faculty of Engineering and Islamic Architectures

Abstract

In this paper, we reported on the design and fabrication of the edge coupling traveling wave ZnO photodetectors (TWPD). In this device structure, the incident light propagates and gets absorbed along the longitudinal direction of a ZnO layer. Unlike the conventional photodetectors (i.e., vertical illumination onto detector surface), light absorption is not limited by the film thickness or by the blocking of the incident light through the metal electrodes, but can reach near 100%. Another advantage of this structure is that it can be easily integrated with other waveguide structures for optical inputs and/or electrical outputs. The key parameters for designing the edge coupling ZnO TWPD were characterized. These requirements are good ohmic contacts, low dark current and high photoresponse.

Item Type:Journal
Keywords:Carrier’s transit time, Dark current, MSM-PD, Photocurrent, ZnO.
Subjects:T Technology, Engineering
ID Code:2428

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